Mid-Infrared Micro-Displacement Measurement with a Bidimensional Silicon Photonic Crystal

dc.contributor.authorTarek Zouache
dc.contributor.authorAbdesselam Hocini
dc.date.accessioned2021-02-15T09:44:39Z
dc.date.available2021-02-15T09:44:39Z
dc.date.issued2020
dc.description.abstractIn this work, a micro displacement sensor based on dual micro-cavities coupled to a photonic crystal waveguide is proposed. The defects are introduced to create a sharp resonance in the structure which makes it useful for detecting micro displacement changes. The sensing principle is based on the change of the output signal transmission with the change of the displacement of a moving part compared to a fixed part of sensor structure. The proposed structure reached a good sensitivity of 9.52a−1en_US
dc.identifier.urihttp://dspace.univ-msila.dz:8080//xmlui/handle/123456789/23818
dc.publisherUniversité de M'silaen_US
dc.titleMid-Infrared Micro-Displacement Measurement with a Bidimensional Silicon Photonic Crystalen_US
dc.typeArticleen_US

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